57th IEEE Holm Conference on Electrical Contacts
Conference Program

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 Technical Program

Arc Interruption I 

1.1        Low-voltage arc simulation with out-gassing polymers

        Christian Rümpler, Fraunhofer Institute SCAI, Germany; Hartwig Stammberger, Eaton Industries   

       GmbH, Germany; and Albert Zacharias, Eaton Industries GmbH, Germany

1.2       Experimental investigation of the interaction of interrupting arcs and gassing polymer walls

                Diego Gonzalez, Technische Universitaet Ilmenau, Germany;Heinz Pursch, Eaton Industries GmbH, Germany; and Frank Berger, Technische Universitaet Ilmenau, Germany

1.3       Influence of Voltage and Current on Arc Duration and Energy of DC Electromagnetic Contactor

                Kiyoshi Yoshida, Nippon Institute of Technology, Japan; Koichiro Sawa, Nippon Institute of Technology, Japan; Kenji Suzuki, Fuji Electric FA Components & Systems Co., Ltd., Japan; Masaaki Watanabe, Fuji Electric FA Components & Systems Co., Ltd., Japan; and Hideki Daijima, Fuji Electric FA Components & Systems Co., Ltd., Japan

 

Young Investigator Award          

2.1       A Preliminary Investigation of Graphite, Graphene and Carbon Nanotubes (CNT's) As Solid State Lubricants

            Andrew Loyd, TE Connectivity, United States;Jessica Hemond, TE Connectivity, United States; and Rod Martens, TE Connectivity, United States

2.2       Contact Resistance with Dissimilar Materials: Bulk Contacts and Thin Film Contacts

            Peng Zhang, University of Michigan - Ann Arbor, United States;Y. Y. Lau, University of Michigan - Ann Arbor, United States;W. Tang, Air Force Research Laboratory, United States;M. R. Gomez, Sandia National Laboratories, United States;D. M. French, Air Force Research Laboratory, United States;J. C. Zier, Naval Research Laboratory, United States; and R. M. Gilgenbach, University of Michigan - Ann Arbor, United States

2.3       Arc Fault Model of Conductance. Application to the UL1699 Tests Modeling

Jonathan ANDREA, esterline, France;patrick schweitzer, lien, France; and JM Martel, SIEMENS, Germany

2.4       High current arc erosion on copper electrodes in air

Thomas Øyvang, Telemark University College, Norway;Elin Fjeld, Telemark University College, Norway;Wilhelm Rondeel, Telemark University College, Norway; and Svein Thore Hagen, Telemark University College, Norway

2.5       Whisker Growth Under Controlled Humidity Exposure

Erika Crandall, Auburn University, United States; George Flowers, Auburn University, United States; Pradeep Lall, Auburn University, United States; and Michael Bozack, Auburn University, United States

 

Fundamentals

3.1       The Effects of Current Density Variations in Power Contact Interfaces

            Robert Malucci, RD Malucci Consulting, United States

3.2       Direct Observation of Current Density Distribution in Contact Area by Using Light Emission Diode Wafer

            Shigeru Sawada, Mie Univ., Japan; Shigeki Tsukiji, Mie Univ., Japan; Terutaka Tamai, AutoNetworks Technologies, Ltd., Japan; Yasuhiro Hattori, AutoNetworks Technologies, Ltd., Japan; and kazuo Iida, Mie Univ., Japan

3.3       Effect of Contact Parameters on Current Density Distribution in a Contact Interface

                Marjorie Myers, TE Connectivity, United States;Michael Leidner, TE Connectivity, Germany; and Helge Schmidt, TE Connectivity, Germany

 

Fretting

4.1       Fretting behavior of nickel coatings for electrical contact applications

            Sophie Noël, Supelec, France; David Alamarguy, Supelec, France; Sandra Correia, Supelec, France; and Pierre Laurat, Legrand, France

4.2       Research on fretting resistance and fretting wear property of Ni-Au contact pair

                Xue-Yan Lin, Research Lab of Electrical Contacts, BUPT, China;Liang-Jun Xu, Research Lab of Electrical Contacts, BUPT, China;Yan-Chao Shao, Research Lab of Electrical Contacts, BUPT, China; and Guo-Ping Luo, Nokia Coorperation, Finland

4.3       Measurement of Contact Resistance Distribution in Fretting Corrosion Track for the Tin Plated Contacts

            Soushi Masui, Mie Univ., Japan;Shigeru Sawada, Mie Univ., Japan;Terutaka Tamai, AutoNetworks Technologies, Ltd., Japan;Yasuhiro Hattori, AutoNetworks

 

Relays / Arcing

5.1       Contact resistance characteristics of relays operated in silicone-vapor-containing and non-silicone atmospheres with different electrical load conditions

            Makoto Hasegawa, Chitose Institute of ScienceTechnology, Japan;Nanae Kobayashi, Chitose Institute of ScienceTechnology, Japan; and Yoshiyuki Kohno, Kaneka Corporation, Japan

5.2       Evaluation of contact surface damages with an optical cross-section method

                Makoto Hasegawa, Chitose Institute of ScienceTechnology, Japan; and Keisuke Takahashi, Chitose Institute of Science and Technology, Japan

5.3       The Effect of mechanical parameters of switch-type contact on relay operation characteristics

                Wanbin Ren, Harbin Inst. of Tech., China;Songjun Ma, Harbin Inst. of Tech., China;Guofu Zhai, Harbin Inst. of Tech., China; and Huadong Xu, Beijing GO-WELL

5.4       Development of Contact Material Solutions for Low-Voltage Circuit Breaker Applications (2)

                Timo Mützel, Umicore AG & Co. KG, Germany; and Ralf Niederreuther, Umicore AG & Co. KG, Germany

5.5       Transient Phenomena from Melting to Electric Discharge during Making and Breaking Operations of Electric Contacts

                Noboru Wakatsuki, Ishinomaki Senshu Univ., Japan;Takayuki Kudou, Ishinomaki Senshu Univ., Japan; and Nobuo Takatsu, Ishinomaki Senshu Univ., Japan

 

Arc Fault / Electrical Safety

6.1       RF Current Produced from Electrical Arcing

            John Shea, Eaton Corporation, United States; and Jason Carrodus, Eaton Corporation, United States

6.2       Method to Design Arc Fault Detection Algorithm using FPGA

            Michaël Rabla, Université Henri Poincaré, France; and Patrick Schweitzer, Université Henri Poincaré, France

6.3       Influence of Capacitive and Inductive Loads on the Detectability of Arc Faults

                Peter Müller, University of Stuttgart, Germany;Stefan Tenbohlen, University of Stuttgart, Germany;Reinhard Maier, Siemens AG, Germany; and Michael Anheuser, Siemens AG, Germany

6.4       Characteristics of Overheated Electrical Joints due to Loose Connection

            Xin Zhou, Eaton Corporation, United States; and Thomas Schoepf, Eaton Corporation, United States

 

Mort Antler Lecture

Modern Design of Experiments (DOE) After 75 Years of Advancements in Multifactor Test Methods

Mark Anderson, Principal and General Manager, Stat-Ease Inc.

 

Modelling    

7.1       Numerical study of asperity distribution in an electrical contact

                Per Lindholm, ABB Corporate Research, Sweden

7.2       Computational Modeling and Analysis of a Contact Pair for the Prediction of Fretting Dependent Electrical Contact Resistance

                Keiji Mashimo, Furukawa Electric co., ltd., Japan; and Yasuyuki Ishimaru, FITEC Corp., Japan

7.3       A Discrete analysis of gold surface asperities deformation under spherical nano-indentation towards electrical contact resistance calculation

                Brice Arrazat, Centre Microélectronique de Provence - Georges Charpak, Ecole Nationale Supérieure des Mines de Sain, France; Pierre-Yves Duvivier, CEA, Leti, Minatec, Grenoble, France, France; Vincent Mandrillon, CEA, Leti, Minatec, Grenoble, France, France; and Karim Inal, Centre Microélectronique de Provence - Georges Charpak, Ecole Nationale Supérieure des Mines de Sain, France

7.4       The Effect of Coil on Combined Three-Subsection Permanent Magnet in Close Magnetic Circuit Model

                You Jiaxin, Harbin Institute of Technology, China; Liang Huimin, Harbin Institute of Technology, China; Ye Xuerong, Harbin Institute of Technology, China; and Zhai Guofu, Harbin Institute of Technology, China

 

MEMS/Micro-Contact  

8.1       Gold Coated Carbon-Nanotube Surfaces as Low Force Electrical Contacts for MEMS devices: Part II, Fine Transfer Mechanisms

John McBride, University of Southampton, United Kingdom; Mark Spearing, University of Southampton, United Kingdom; Liudi Jiang, University of Southampton, United Kingdom; and Chamaporn Chianrabutra, University of Southampton, United Kingdom

8.2       A Nano-scale Investigation of Material Transfer Phenomena at Make in a MEMS switch

                Christophe Poulain, CEA-LETI, France;Alexis Peschot, CEA-LETI, France;Maxime Vincent, University of California, Berkeley, United States; and Nelly Bonifaci

8.3       Compliant Carbon Nanotube-Metal Contact Structures

Onnik Yaglioglu, Massachusetts Institute of Technology, United States;Rod Martens, Massachusetts Institute of Technology, United States;Anyuan Cao, Peking University, China; and A. H. Slocum, Massachusetts Institute of Technology, United States

 

Connector Degradation I  

9.1       A Summary Report on the Mechanism of Electric Contact Failure due to Particle Contamination

            Ji Gao Zhang, Emeritus Professor, China

9.2       Correlation of Intrinsic Thin Film Stress Evolution and IMC Growth with Whisker Growth

                Chad Rodekohr, Presbyterian College, United States;George T. Flowers, Auburn University, United States;Michael J. Bozack, Auburn University, United States;Rob Jackson, Auburn University, United States;Rod Martens, TE Connectivity, United States;Zhijun Zhao, Western Digital, United States;Erika Crandall, Auburn University, United States;Vern Starman, Air Force Institute of Technology, United States;Thomas Bitner, Presbyterian College, United States; and Jacob Street, Presbyterian College, United States

9.3       A Study on Mobile Communication Device Structure Design Resisting Dust Particles Ingress

                Na Lu, Beijing University of Posts and Telecommunications, Beijing, China

 

Arc Interruption

10.1     A Study of arc duration on supple carbon contacts in the automotive field

            Jerome Praquin, Renault, France; Chistophe Gautherot, Renault, France; Jean Rivenc, Renault, France; Nourredine Ben Jemaa, University of Rennes, France

10.2     Effects of rotational motion of break arcs on arc duration and contact erosion

                Junya Sekikawa, Shizuoka University, Japan; and Takayoshi Kubono, Shizuoka University, Japan

10.3     AC Electrical Arcs With Graphite Electrodes

                Erwann Carvou, Universite de Rennes 1, France;Brian Mitchell, Universite de Rennes 1, France;Noureddine Ben Jemaa, Universite de Rennes 1, France;Simon Tian, Schneider Electric, France; and Zakaria Belhaja, Schneider Electric, France

 

High Power Sliding/Contact Resistance   

11.1     Effect of Lubricant on Degradation Process of Au-plated Slip-Ring and Ag-Pd Brush System for Small Electric Power

            Koichiro Sawa, Nippon Institute of Technology, Japan;Yasunori Suzuki, Nippon Institute of Technology, Japan;Noboru Morita, Nippon Institute of Technology, Japan;Takahiro Ueno, Nippon Institute of Technology, Japan; and Kaoru Endo, Nideco Servo Corporation, Japan

11.2     Pantograph Arc's Energy Characters Under Various Load

                Bo Wang, Southwest Jiaotong University, China; Guangning Wu, Southwest Jiaotong University, China; Lijun Zhou, Southwest Jiaotong University, China

11.3     Pantograph Arcing's Impact on Locomotive Equipments

            Tianzhi Li, Southwest Jiaotong University, China;Guangning Wu, Southwest Jiaotong University, China;Lijun Zhou, Southwest Jiaotong University, China;Guoqiang Gao, Southwest Jiaotong University, China;Wangang Wang, Southwest Jiaotong University, China;Bo Wang, Southwest Jiaotong University, China;Donglai Liu, Southwest Jiaotong University, China; and Dajian Li, Southwest Jiaotong University, China

11.4     An Experimental Study to show the behavior of Electrical Contact Resistance and Coefficient of Friction at Low Current Sliding Electrical Interfaces

            Siddeswara Prasad Veeranna, Siddaganga Institute of Technology, India;Prashant Misra, Indian Institute of Science Bangalore, India; and Nagaraju Jampana, Indian Institute of Science Bangalore, India

 

Sliding  

12.1     There is tin and there is tin – characterisation of tribological and electrical properties of electroplated tin surfaces

                Frank Ostendorf, Weidmueller Interface GmbH & Co. KG, Germany;Thomas Wielsch, Weidmueller Interface GmbH & Co. KG, Germany; and Michael Reiniger, Weidmueller Interface GmbH & Co. KG, Germany

12.2     Study on Characterization of Electrical Contact Between Pantograph and Catenary

            Wangang Wang, Southwest Jiaotong University, China; Anping Dong, Southwest Jiaotong University, China; Guangning Wu, Southwest Jiaotong University, China; Guoqiang Gao, Southwest Jiaotong University, China; Lijun zhou, Southwest Jiaotong University, China; Bo wang, Southwest Jiaotong University, China; and Yi Cui, Southwest Jiaotong University, China

12.3     The Effect of Various Atmospheric Temperature on the Contact Resistance of Sliding Contact on Silver Coating Slip Ring and Silver Graphite Brush

                Emad Barnawi, Nippon Institute of Technology, Japan; Koichiro Sawa, Nippon Institute of Technology, Japan; Noboru Morita, Nippon Institute of Technology, Japan; and Takahiro Ueno, Nippon Institute of Technology, Japan

 

Connectors/Contact Resistance   

13.1     Peculiar Phenomenon in Friction Coefficient of Tin Plated Connector Contacts with Application of Lubricant

                Terutaka Tamai, Elcontech consulting, Ltd., Japan; Shigeru Sawada, Mie University, Japan; and Yasuhiro Hattori, AutoNetworks Technologies, Ltd., Japan

13.2     Stress Analysis of Dust Particle on the Electrical Contact Surface

                Yang Lv, Electric Contact Lab Automation School Beijing University of PostsTelecommunications, China; and Liangjun Xu, Electric Contact Lab Automation School Beijing University of Posts and Telecommunications, China

13.3     Stress-Strain Response of Copper-based Spring Materials under Forward and Reverse Deformations and Its Mathematical Description

                Yasuhiro HATTORI, AutoNetworks Technologies, Ltd., Japan;Kingo FURUKAWA, AutoNetworks Technologies, Ltd., Japan; and Fusahito YOSHIDA, Hiroshima

 

Connector Degradation II   

14.1     Growth of Sn Whiskers Under Net Compressive and Tensile Stress States

                Erika Crandall, Auburn University, United States; George Flowers, Auburn University, United States; Robert Jackson, Auburn University, United States; Pradeep Lall, Auburn University, United States; and Michael Bozack, Auburn University, United States

14.2     Degradation phenomena of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism- Contact resistance and its model

                Shinichi Wada, company, Japan; and Koichiro Sawa, university, Japan

14.3     The Influence of the Organic Compounds on the Contaminated Electrical Contacts

            YILIN ZHOU, Beijing University of PostsTelecommunications, China;YANG LV, Beijing University of PostsTelecommunications, China; and HAO WANG, Beijing University of Posts and Telecommunications, China

14.4     Selected aspects of the electrical behavior in sliding electrical contacts

Christian Holzapfel, Schleifring und Apparatebau GmbH, Germany

 

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