IEEE-CPMT Society TC-1 Committee
on Electrical Contacts
Tuesday September19, 2009
Chair: G. Witter
Vice-Chair: Bob Malucci
Secretary: C. Leung
Holm Conference Attendees
Opening: G. Witter
· TC-1 of IEEE-CPMT meeting was called to order by Chairman G. Witter.
1. Approval of minutes of previous meeting - G. Witter
· 2008 meeting minute has been posted at
web page. It was approved.
2. Preliminary Report on 55rd IEEE-Holm Conference – Ed Smith
· Total registration is over 100 with representatives from 6 countries.
Total of 51
technical papers with contributions from
· Antler Lecture was presented by Dr. Frank Mucklich, Saarland Univrsity, “Nanotomography of Electrical Contacts – New Insights by High Resolution 3D Analysis of Local Material Degradation”
· Technical contents, audio visuals were good with no negative comments
· The dinner social on Monday was well attended by 96 including spouses at the Grand Concourse.
The Joint International Conference and 2010 IEEE
Holm Conference will be in
3. Report on Intensive Course on Electrical Contact - Paul Slade
There is no course offered in 2009 but there
will be a 3 day course in
· Connectors and arcing applications are of good interest
· Suggestions were taken from the student feedbacks to modify the course for 2010
· Course offered every 2 years is considered a good plan.
4. Report on CPMT Transaction –John McBride
· CPMT now considers the Holm conference proceedings as an archived publication and will no longer take papers directly from the conference for second publication in CPMT journal
· Good conference papers should be resubmitted with some additional work for new CPMT publication
· CPMT is a slow process. Eeven after fully reviewed, papers can take another 6 months to complete
It will take about 1 year for 2009 papers to be
· Changes from the conference paper must be considered significantly different for CPMT publication
· Can submit as single column or double column format
· Papers can appear earlier online in IEEE than printed material
5. World Calendar
Professor Jigao Zhang
reported that the 3rd International Conference on Reliability of Electrical
Products and Electrical Contacts in
· ISDEN 2010
Annual Electromechanical Engineering Meeting in
· ECTC meeting – in place of the Relay Conference, see Frank Rufino of Molex for info.
6. Publicity –
· Web and CPMT newsletter will be the primary medium for TC1 and Holm information. Many members have used the web for info and registration to conference.
8. IEICE Tranaction – Professor
IEICE Transaction (
· Contact email@example.com for paper submission details
8. TC1 sub-committee Reports:
Material restrictions and substitution – Dr. Volker Behrens
EVL (End of Vehicle Life, Cd use in autos, no change from the past
ROHS consumer products, Cd allowed but subject to technical review again in 2014
REACH decrete, e.g. CdO will have to be registered and evaluated depending on current knowledge of the chemical
WEEE still in effect
Henry Czajkowski : NEMA
is taking a proactive approach while some states try to adopt ROHS regulations.
NEMA new strategic initiative is to influence legislative to be uniform and not
as restrictive. Nickel ban is not an issue. Pb free
tin plating has issues with tin whiskers. CA has adoption same
Frequency Connectors – Roland Timsit
Booming demand for technical expertise; 1-2GHz now, skin depth challenges to material selection; capacitance effects from Circuit Boards; 2 papers in the 2009 Holm cover some of the problems
MEMs and micro-contact technology – Bob Malucci
25 papers related to MEMs and connector field in this year’s Holm conference; 5 are in MEM; 3 are on crimp designs and reliability; Ag platin for high frequency connectors because of good conductivity on skin effects.
Controls Technology - Henry Czajkowski
Cd is still allowed in North America and not much change; new designs maybe looking at Cd free especially in NEMA; low cost drivers are still important; NEMA an IEC, China spec (low cost device) with some reduced performance are now into products with Chinese manufacturers; AgSnO2 papers are good for keeping up with the future; IEC tends to be Cd free; NEMA depends, if IEC assigned to NEMA device, then it maybe Cd free
Vacuum Contactors – Paul Slade: strong
trend in the 1000A 1000V with vacuum interrputers;
renewable energy areas such as wind mills use CuCr
for this power range; VI has size advantages; no standards in these new
applications but size is definitely important
Arc fault detection – Dr. Xin Zhou
AFCI more momentum world wide; also may apply to new industrial applications; European AFCI at 220V is very different and need research; circuit breakers are now design to be low cost applications in China; renewable energy and solar applications would need new research in power switching
Telecommunication – Werner Johler
Challenges are in switching of low level; market in 2009 was more resilient than other industries; trend to smaller and more efficient are pushing limits; contact resistance to be reduced from 200 milliohm to 2-3 milliohms; frequency at 50kHz now is to be .5 GHz; ambient to be 125C; latching designs getting to be more important since it helps temperature and energy; quality requirement is zero defect; higher isolation requirements such as 2500V open contacts; IEC working on new standards; solid state relays not happening.
Automotive – Thomas Schoeph:
DC switching 300VDC for Hybrids; DC bus for solar and renewable applications