The final program is now complete with the
following highlights –
technical program with 51 papers covering 3 days dealing with both
theoretical and practical investigations on nano-ampere
to kilo-ampere problems.
Sessions on Arc Fault / Safety, Contact Fundamentals, Arc
Interruptions, Sliding Contacts, Connector Design / Modeling,
Fretting, Material / Surface Finish, Arcing Contact Material,
Connector Reliability, MEM Micro-Electro-Mechanical Devices
Mort Antler Lecture by Professor Frank Muecklich,
Saarland University, Germany on the new technology of Nanotomography of Electrical Contacts – New Insights
by High Resolution 3D Analysis of Local Material Degradation.
Awards Luncheon and Conference Dinner for relaxed discussions and
– published July 27, 2009
Technical Program with link to paper abstracts
- published July 29,2009