Holm 2009 – 55th IEEE Holm Conference on Electrical Contacts

The Holm Conference began in 1953 as a forum for the discussion of electrical contact phenomena and related fields. In 1968, the conference was named the Holm Conference in honor of Dr. Ragnar Holm. Dr. Holm, whose contributions to the field of electrical contacts spanned 50 years and form the foundation of the electrical contacts field, was the inspiration and guide of the Conference from its inception until his death in 1970. In 1985, IEEE society started sponsoring the conference as a recognition of its importance in the field of electrical engineering. In addition to the Annual Conference, the Conference Organization regularly conducts an intensive 3 day course on contacts and participates in the biannual International Conference on Electrical Contacts.  The 2008 Intensive Course on Electrical Contacts was held from Oct 23-25 at the Florida Conference Hotel and attended by 22 enthusiastic engineers.

To provide a forum for the presentation and discussion of the latest developments in the field of electric contacts and the application of recent advances in materials and processes in electric, electronic and telecommunication equipment. In 2008, we had a successful 54th IEEE Holm Conference in Orlando, Florida with over 120 international attendee presenting 52 papers.

2008 lectures and hot topics included:

Ragnar Holm Scientific Award presentation “High Current AC Break Arc Contact Erosion” by Dr. John Shea, Eaton Corporation, USA

Morton Antler Lecture “Interplay Between Electromechanical and Solid State Switching Technologies" by DR. Thomas Schoepf, Eaton Corporation, USA.

For Whom
Practicing designers, engineers, physicists and research scientists - those new to the field and those experienced. The 2009 Holm Conference will include excellent papers authored by some of the outstanding technical people in this field. We expect to have around 40 presentations from US and international engineers and scientists. These papers will provide the attendees with up-to-date information on a wide range of subjects that makes this conference so attractive to the practicing engineer.
Timely topics are also organized through the Dr. Morton Antler Lecture with past lectures on electrical contact, 42V challenges, and connector reliability, arc fault & safety, miniaturization of electromechanical relays, dust effects on switch and connector reliability.

The conference is sponsored by the Components, Packaging and Manufacturing Technology (CPMT) Society of the Institute of Electrical & Electronics Engineers, Inc. (IEEE). For 2008, the conference also received financial assistance from the following sponsors: AMI Doduco, Brainin, Checon Corporation, CMW, Inc. Umicore Technical Materials, Research and Engineering Society for Electromechanical Components and Contact Technology in Japan (Mie University), Deringer Ney, Inc., Eaton Corporation, Molex, Inc., Moog Components group, and Rockwell Automation.

The conference normally lasts between two and a half to three days and includes over 40 Technical Papers, the Ragnar Holm Scientific Achievement Award, and the Dr. Morton Antler Lecture. They highlight the most recent electrical contact work all over the world.

Contacts Properties and Performance, Connector Contacts, Sliding Contacts, Aluminum Contacts, Arcing Contacts, Silver Metal Oxide Contacts, Micor-electro-mechanical Systems, Automotive Switches and Relays, Superconductor Contacts, Circuit Breaker and Contactors for power distribution, Nano contact measurements and Real world Design and Applications Problems are familiar themes in the presentation.

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