Holm 2009 – 55th IEEE Holm
Conference on Electrical Contacts
The Holm Conference began in 1953 as a forum for the discussion of electrical
contact phenomena and related fields. In 1968, the conference was named the
Holm Conference in honor of Dr. Ragnar Holm. Dr.
Holm, whose contributions to the field of electrical contacts spanned 50
years and form the foundation of the electrical
contacts field, was the inspiration and guide of the Conference from its
inception until his death in 1970. In 1985, IEEE society started sponsoring
the conference as a recognition of its importance in
the field of electrical engineering. In addition to the Annual Conference,
the Conference Organization regularly conducts an intensive 3 day course on
contacts and participates in the biannual International Conference on
Electrical Contacts. The 2008
Intensive Course on Electrical Contacts was held from Oct 23-25 at the
Florida Conference Hotel and attended by 22 enthusiastic engineers.
To provide a forum for the presentation and discussion of the latest
developments in the field of electric contacts and the application of recent
advances in materials and processes in electric, electronic and
telecommunication equipment. In 2008, we had a successful 54th IEEE Holm
Conference in Orlando, Florida with over 120 international
attendee presenting 52 papers.
lectures and hot topics included:
Ragnar Holm Scientific Award presentation
“High Current AC Break Arc Contact Erosion” by Dr. John Shea, Eaton
Antler Lecture “Interplay Between Electromechanical and Solid State
Switching Technologies" by DR. Thomas Schoepf,
Eaton Corporation, USA.
Practicing designers, engineers, physicists and research scientists - those
new to the field and those experienced. The 2009 Holm Conference will include
excellent papers authored by some of the outstanding technical people in this
field. We expect to have around 40 presentations from US and international
engineers and scientists. These papers will provide the attendees with
up-to-date information on a wide range of subjects that makes this conference
so attractive to the practicing engineer.
Timely topics are also organized through the Dr. Morton Antler Lecture with
past lectures on electrical contact, 42V challenges, and connector
reliability, arc fault & safety, miniaturization of electromechanical
relays, dust effects on switch and connector reliability.
The conference is sponsored by the Components, Packaging and Manufacturing
Technology (CPMT) Society of the Institute of Electrical
& Electronics Engineers, Inc. (IEEE). For 2008, the
conference also received financial assistance from the following sponsors:
AMI Doduco, Brainin, Checon
Corporation, CMW, Inc. Umicore Technical Materials,
Research and Engineering Society for Electromechanical Components and Contact
Technology in Japan (Mie University),
Deringer Ney, Inc., Eaton Corporation, Molex, Inc.,
Moog Components group, and Rockwell Automation.
The conference normally lasts between two and a half to three days and includes
over 40 Technical Papers, the Ragnar Holm
Scientific Achievement Award, and the Dr. Morton Antler Lecture. They
highlight the most recent electrical contact work all over the world.
Contacts Properties and Performance, Connector Contacts, Sliding Contacts,
Aluminum Contacts, Arcing Contacts, Silver Metal Oxide Contacts, Micor-electro-mechanical Systems, Automotive Switches and
Relays, Superconductor Contacts, Circuit Breaker and Contactors for power
distribution, Nano contact measurements and Real
world Design and Applications Problems are familiar themes in the
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