48th IEEE Holm Conference on Electrical Contacts - Orlando
Technical Program
Monday October 21, 2002

  Introduction and Opening Remarks
Chi Leung, 2002 Holm Conference Chair
8:00 AM
  Holm Scientific Achievement Award
Contacts Conduction and Switching in DC Levels
N. Ben Jemaa, University of Rennes 1, France
8:10-9:10
  Coffee Break 9:10-9:30
1 Session 1 - Low Current I (Gerald Witter / Philip Wingert) 9:30-10:50
1.1 Influence of Arc Duration and Current on Contact Welding in Low Power Switches
Alexander R. Neuhaus, Werner F. Rieder, Martin Hammerschmidt, Vienna University of Technology, Austria
Abstract 1:1
1.2 Material Transfer in Dynamic Welding of Ag and Ag/SnO2 Contact Material
Chi Leung, Eric Streicher, AMI DODUCO, PA
Abstract 1:2
1.3 IModel on Sputter Erosion of Electrical Contact Material
Xixiu Wu, Zhenbiao Li, Huazhong University of Science & Technology, P.R. China
Abstract 1:3
1.4 Measurement of Electric Contact Phenomenon Using LiNbO3 Piezoelectric Actuator
Yu Yonezawa, Noboru Wakatsuki, Ishinomaki Senshu University, Japan
Abstract 1:4
  Coffee Break 10:50-11:10
2 Session 2 - Relays (Thomas Schoepf / Pat Lees) 11:10-12:30
2:1 Impact of Lead-free Soldering Processes on the Performance of Signal Relay Contacts
Werner Johler, Tyco Electronics AXICOM, Switzerland
Abstract 2:1
2:2 The Research on Electrical Life Test Condition of Relay with Electromotor Load
Du Taihang, Jianguo Lu Geng Lihui, Zhigang Li, Hebei University of Technology, PR China
Abstract 2:2
2:3 Reliability Analysis and Failure Prediction Study of Dynamic Contact Resistance on Contact
ZhiGang Li, Dong Jiang, WenHua Li, XiuPing Su, Hui Guo, Hebei University of Technology, P.R. China
Abstract 2:3
2:4 The Effects of Material Transfer in Relays Diagnosed by Voltage Measurement
Martin Hammerschmidt, Alexander R. Neuhaus, Werner F. Rieder, Vienna University of Technology, Austria
Abstract 2:4
  Lunch (on your own) 12:30-2:00
3 Session 3 - High Current I ( Paul Slade / Henry Czajkowski) 2:00 - 3:00
3:1 Gassing Arc Chamber Wall Material Effect on Post Current-Zero Recovery Voltage Breakdown
John J. Shea, Eaton Corporation, PA
Abstract 3:1
3:2 Study of Reliability Test and Analysis for Miniature Circuit Breakers
YanYan Luo, JianGuo Lu, ZhiGang Li, Hebei University of Technology, P.R. China
Abstract 3:2
3:3 The Correlation of Arc Root Motion, Magnetic Field and Dynamic in Low Velocity Circuit Breakers
K Pechrach, J.W.McBride, University of Southampton, United Kingdom; P.M Weaver, PBT Ltd, United Kingdom
Abstract 3:3
  Coffee Break 3:00-3:30
4 Session 4 - High Current II (Manfred Lindmayer / John Shea) 3:30 - 5:00
4:1 Effect of Cu Content on the Electrical Erosion of Tungsten Copper Contacts Switching Load-Current in Vacuum
Wangpei Li, Paul G. Slade, Leslie D. Loud, Richard E. Haskins Jr., Cutler-Hammer Inc., NY
Abstract 4:1
4:2 Simulation of Arc Discharge Modes in Vacuum Chamber
A. Sokolov, Ulyanovsk State University, Russia
Abstract 4:2
4:3 Influence of Inductance on the Arc Evolution in AgMeO Electrical Contacts
S.N. Kharin, H. Nouri, T. Davies, University of the West of England, United Kingdom
Abstract 4:3
  Social - Polynesian Luau at Sea World 5:30 pm

Tuesday, October 22, 2002

5 Session 5 - Automotive (Ed Smith / Chi Leung) 8:15 - 9:15
5:1 Disengaging Connectors Under Automotive 42 VDC Loads
Thomas J. Schoepf, Delphi Research Labs, MI; George A. Drew, Delphi Packard Electric Systems, OH
Abstract 5:1
5:2 Make Arc Parameters and Subsequent Erosion under 42 VDC in Automotive Area
N. Ben Jemaa, L. Morin, University of Rennes 1, France; L. Doublet, D. Jeannot, F. Hauner, Metalor Technologies
(France) SAS, France
Abstract 5:2
5:3 Vibration Thresholds for Fretting Corrosion in Electrical Connectors
George T. Flowers, Fei Xie, Michael Bozack, Auburn University, AL; Robert D. Malucci, Molex Corporation, IL
Abstract 5:3
  Coffee Break 9:15-9:35
6 Session 6 - Contact Degradation (George Drew / Brett Rickett) 9:35-10:35
6:1 Degradation of Power Contacts in Industrial Atmosphere: Silver Corrosion and Whiskers
Bella H. Chudnovsky, Square D Company, OH
Abstract 6:1
6:2 Friction and Wear Properties of Tin Plated Sliding Contacts under Oil Lubricated Condition
Hiroyuki Nakagawa, Koei Matsukawa, Mitsubishi Electric Corporation, Japan
Abstract 6:2
6:3 Properties of Corrosion Stains on Thin Gold Plating
Xue-Yan Lin, Ji-Gao Zhang, Beijing University of Posts and Telecommunications, P.R. China
Abstract 6:3
  Morton Antler Lecture
The Role of Electroplates in Contact Reliability
W.H. Abbott, Battelle-Columbus, OH
11:00-12:00
  Awards Luncheon

2002 Ragnar Holm Scientifc Achievement Award -
Dr. N. Ben Jemaa

2002 Armington Recognition Award -
Dr. Chi Leung

2002 Morton Antler Lecture - William Abbott

2001 IEEE Holm Conference Erle Shobert Prize Paper Award
Manfred Lindmayer & Matthias Springstubbe
"3D-Simulation of ARc Motion Between ARc Runners Including the Influence of Ferromagnetic Material"
12:00-1:30
7 Session 7 - Fundamentals (Bob Malucci / Steve Cole) 1:30-2:30
7:1 A Model to Describe Intermittency Phenomena in Electrical Connectors
C. Maul, TaiCaan Technologies Ltd., United Kingdom; J.W. McBride, University of Southampton, United Kingdom
Abstract 7:1
7:2 The Use of Carbon Fiber Composites in Sliding Contacts
Robert F. Stinson, Joseph A. Sarro, Micro Contacts Inc., NY
Abstract 7:2
7:3 A Study on Evaluation with Weibull Distribution Function of Contact Conditions Operated in Inert Gas Atmospheres
Jiro Makimoto, Koichiro Sawa, Keio University, Japan; Makoto Hasegawa, Chitose Institute of Science and Technology, Japan
Abstract 7:3
  Coffee Break 2:30-3:00
8 Session 8 - Fundamentals II (Milenko Braunovic / Dick Moore) 3:00-4:00
8:1 Measurement of Electrical Charges Carried by Dust Particles
Jin Chun Gao, Ji Gao Zhang, Beijing University of Posts and Telecommunications, P.R. China
Abstract 8:1
8:2 Dynamics of Electrical Contact Floating in Vacuum
S.N. Kharin, H. Nouri, University of the West of England, United Kingdom; D. Amft, Technical University of Chemnitz, Germany
Abstract 8:2
8:3 Contact Resistance Characteristics of High Temperature Superconduting Bulk
Tomokazu Sakai, Naoki Yamamoto, Koichiro Sawa, Keio University, Japan; Masaru Tomita, Railway Technical Research Institute, Japan; Masato Murakami, Superconducting Research Laboratories, ISTEC-Superconductivity Research Laboratories, Japan
Abstract 8:3
  TC-1 Meeting (Gerald Witter) 4:15-5:30

Wednesday, October 23, 2002

9 Session 9 - High Frequency (Roland Timsit / Bill Balme) 8:30-9:30
9:1 The Impact of Contact Resistance on High Speed Digital Signal Transmission
Robert D. Malucci, RD Malucci Consulting, IL
Abstract 9:1
9:2 Scattering Parameter Model of Low Level Electrical Contacts in Electro-mechanical Microwave Switches - A Switch Manufacturer Approach
Regina Kwiatkowski, Mihai Vladimirescu, Andre Zybura, Savio Choi, COM DEV International, Canada
Abstract 9:2
9:3 A Sensitivity - Analysis on Design Parameters and Tolerances of Signal Integrity of High Speed Data Transfer Connectors
Achim Brenner, Horst F. Nowacki, HARTING KGaA, Germany
Abstract 9:3
  Coffee Break 10:10-10:40
10 Session 10 - Connectors (John McBride / Bob Malucci) 10:00-11:40
10:1 Effect of Connector Design on the Performance of Service Entrance Power Connectors
M. Braunovic, MB Interface, Canada
Abstract 10:1
10:2 A new method to investigate electrical conduction in crimp joints Influence of the compaction ratio and electrical model
G. Rosazza Prin, T. Courtin, FCI France, France; L. Boyer, Laboratoire de Génie Electrique de Paris, France
Abstract 10:2
10:3 Evaluation of Crimped Terminations and Splices in In-Wall Electric Heaters
J. Aronstein, Consulting Engineer, NY; R. Butturini, U.S. Consumer Product Safety Commission, DC
Abstract 10:3
10:4 Load Tap-Changers: Investigations of Contacts, Contact Wear and Contact Coking
Hans-Ulf Schellhase, Robert G. Pollock, Avaral S. Rao, Erik C. Korolenko, Powertech Labs Inc., Canada; Barry Ward, EPRI, Palo Alto, CA
Abstract 10:4
10:5 High Temperature Lubricants for Power Connectors Operating at Extreme Conditions
D. Gagnon, IREQ, Canada; M. Braunovic, MB Interface, Canada
Abstract 10:5
  Back to Final Program Front

Back to TC-1 Home