46th IEEE Holm Conference on Electrical Contacts - Chicago
Technical Program
Monday, September 25, 2000

 

Introduction and Opening Remarks (Robert Malucci)

8:20 AM

1

Session I - Connectors I (Milenko Braunovic / Stephen Cole)

8:40 - 10:00

1:1

Contact Stress Relaxation and Resistance Change Relationships in Accelerated Heat Age Testing, K.L. Beach, V.C. Pascucci, Tyco Electronics, Harrisburg, PA.

Abstract 1:1

1:2

The Electrical and Mechanical Performance of Corroded Products on gold Plating after Long Term Indoor Air Exposure, Y.L. Zhou, X.Y. Lin, J.G. Zhang, Beijing University of Posts & Telecommunications, China.

Abstract 1:2

1:3

Sliding Wear Experiments on Clad Gold-Nickel Material Systems Lubricated with a 6-Ring Polyphenyl Ether, N.R. Aukland, H. Hardee, New Mexico State University, Las Cruces, NM; P. Lees, Technical Materials, Inc., Lincoln, RI.

Abstract 1:3

1:4

Reliability Assessment of Compression Contact for Socketable Components, A.R. Nagel, C.Gonzalez, C. Frutschy, Intel Corporation, Chandler, AZ.

Abstract 1:4

 2

Session 2 - Connectors II (Pat Lees / Richard Moore)

10:30: 11:30

2:1

Optimization of Shape Memory Alloys for Use in Electrical Connectors, T.J. Yurick, Jr., S.E. Mohney, G.L. Gray, Penn State Univeristy, University Park, PA.

Abstract 2:1

2:2

Combination Effect of Fretting and Corrosion on Bolt-Type Power Connectors, G.P. Luo, L.J. Xu, J.G. Zhang, Beijing University of Posts & Telecommunications, China

Abstract 2:2

2:3

Overheating of Flexible Tinned Copper Connectors, M. Braunovic, MB Interface, Montreal, Canada

Abstract 2:3

3

Session 3 - Low Current Arcing (Gerald Witter / Philip Wingert)

1:00 - 2:40

3:1

Erosion and Contact Resistance Performance of Materials for Sliding Contacts Under Arcing, N.B. Jemaa, L. Morin, University of Rennes, France; D. Jeannot, F. Hauner, Metalor Electrotechnics, France

Abstract 3:1

3:2

Test and Analysis of Reliability for Electromagnetic Relays, K. Li, F. Yao, J. Lu, Z. Li, Bebei University of Technology, P.R. China

Abstract 3:2

3:3

Optimized Contact Erosion by Using Electronegative Gases in Telecom Relays, W. Johler, AXICOM Ltd., Switzerland.

Abstract 3:3

3:4

Mechanisms of the Low Contact Resistance Properties for Ag-Pd-Mg Contacts, T. Tamai, Hyogo University, Japan.

Abstract 3:4

3:5

A Study of Contact Reliability in N-Hexane with Small Load Currents, T. Soma, M. Hasegawa, K. Sawa, Keio University, Japan.

Abstract 3:5

4

Session 4 - Modeling and Testing (Paul Slade / Chi Leung)

3:10 - 4:10

4:1

Study and Reliability Analysis on Testing Instrument for Dynamic Contact Resistance on Contact, W. Li, G. Liu, Z. Li, Hebei University of Technology, China.

Abstract 4:1

4:2

Modeling of Vacuum Reed Failure by Using Finite Element Method, L.J.Xu, J.G.Zhang, Beijing University of Posts & Telecommunications, China; B. Miedzinski, Wroclaw University of Technology, Poland.

Abstract 4:2

4:3

Development of An Application Specific Integrated Circuit for Reduction of Contact Bounce in Three Phase Contactors, J.H. Kiely, H. Nouri, F. Kalvelage, T. Davies, University of the West England, Bristol, United Kingdom.

Abstract 4:3

 

Social at Bubba Gump Shrimp Co. Restaurant & Market

6:00 pm

Tuesday, September 26, 2000

5

Session 5 - High Current Arcing (Werner Reider / Engelber Hetzmannseder)

8:30 - 9:50

5:1

Arc Root Commutation from Moving Contacts in Low Voltage Devices, J.W. McBride, K. Pechrach, University of Southhampton, United Kingdow, PM. Weaver, PBT Ltd., United Kingdom.

Abstract 5:1

5:2

The Unusual Electrical Erosion of High Tungsten Content, Tungsten Copper Contacts Switching Load Current in Vacuum, P.G.Slade, W.Li, L.D. Loud, R.E. Haskins Jr., Cutler-Hammer Inc., Horseheads, NY.

Abstract 5:2

5:3

Erosion Dependency of 3-Phase Contactor Contacts on Configuration of Loads, H. Noun, F. Kalvelage, T.S.Davies, J.H. Kiely, University of the West of England, Bristol, United Kingdom.

Abstract 5:3

5:4

The Influence of Arc Chamber Wall Material on Arc Gap Dielectric Recovery Voltage, J.J. Shea, Cutler-Hammer Inc., Pittsburgh, PA.

Abstract 5:4

6

Session 6 - Fundamentals (John Shea / John McBride)

10:20-11:40

6:1

Contact Current Distortion Due to Tunnel Effect, E. Takano, Sendai, Japan

Abstract 6:1

6:2

Spectroscopic Measurement of Ag Break Arc, K. Yoshida, A. Takahashi, Nippon Institute of Technology, Japan.

Abstract 6:2

6:3

Resistance Change at Copper Contacts with Thin and Thick Oxide Films Under a Zero Force Liquid Gallium Probe, D.R. Liu, S. McCarthy, Ford Motor Company, Dearborn, MI

Abstract 6:3

6:4

Correlation Between Arcing Phenomena and Electromagnetic Noise of Opening Electric Contacts, Y. Ebara, H. Sone, Y. Nemoto, Tohoku University, Japan.

Abstract 6:4

 

Awards Luncheon
1999 IEEE Holm Conference Erle Shobert Prize Paper Award
L. Morin, N. Ben Jamaa, D. Jeannot, J. Picard, L. Nadelec "Make Arc Erosion and Welding in the Automotive Area"
2000 Armington Recognition Award
Dr. Werner Reider

11:40-1:30

7

Session 7 - 42 Volt Tutorial Session (Ed Smith III / Robert Malucci)

1:30-3:00

7:1

The Impact of 42 Volt Automotive Electrical Systems on Electrical Contacts, Robert Beer, Delphi Packard Electric Systems

 

7:2

Seminar on Switching 42V DC Automotive Electrical Circuits, Paul G. Slade, Cutler-Hammer, Horseheads Operations

 

8

Automotive (George Drew / Sean McCarthy)

3:30-4:30

8:1

Lab-Field Correlation Program for Automotive Electrical Connections, F.W. O'Malia, C.M. Cope, G.P. Martin, Delphi Automotive Systems, Warren, Ohio.

Abstract 8:1

8:2

An Influence of Commutation Arc in Gasoline on Brush Wear and Commutator, M. Takaoka, K. Sawa, Keio University, Japan.

Abstract 8:2

8:3

Reliability Improvement for an Automotive Fuel Level Sensor, H.W. Ireland, R.L. Farrar, Delphi Automotive, Flint, MI; E.F. Smith III, The J.M. Ney Company, Bloomfield, CT; R. Cooper, CTS Resistor/Electrocomponents, Berne, IN.

Abstract 8:3

 

TC-1 Meeting (Gerald Witter)

4:30-5:30

Wednesday, September 27, 2000

9

Session 9 - Silver Metal Oxide (Henry Czajkowsi / Michael Myers)

8:30-9:30

9:1

Advanced AgSnO2 Contact materials for the Replacement of AgCdO in High Current Contacts, F. Hauner, D. Jeannot, J. Pinard, Metalor Contat, K. McNeilly, Chemet Corp., Attleboro, MA.

Abstract 9:1

9:2

Study on the Behavior of Silver Rare Earth Oxide Contact Material, J. Wang, B. Wang, M. Wen, Y. Lu, Y. Luo, Z. Li, Hebei University of Technology, P.R. China.

Abstract 9:2

9:3

Influence of the Contact Material on the Performance of Temperature-Dependent Switching Controllers in Household Appliance, V. Behrens, T. Honig, A. Kraus, AMI DODUCO GmbH, Germany

Abstract 9:3

10

Session 10 - Fretting (William Abbott / Ed Smith III)

10:10-11:40

10:1

Influence on the Length and Severity of Intermittences in Electrical Contacts, C. Maui, J.W. McBride, J. Swingler, Unversity of Southhampton, united Kingdom

Abstract 10:1

10:2

Fretting in Copper-to-Copper Contacts under AC and DC Current Conditions, D. Gagnon, IREQ, Varennes, Canada, M. Braunovic, MB Interface, Montreal, Canada.

Abstract 10:2

10:3

Possible Mechanism for Observed Dynamic Resistance, R.D. Malucci, Molex, Inc., Lisle, IL.

 Abstract 10:3

 

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